Webbdepth is 242.5 nm as shown in Figure 1(ii) and total sputtering duration is 820 s. ToF-SIMS data acquisition To measure the secondary ion counts, the PHI nano ToF II TRIFT was used from Physical Electronics, MN, USA. In this process, a 10 ns pulsed liquid metal ion gun (LMIG) uses Gallium (Ga+) sources to produce ions as primary ion Webb飞行时间二次离子质谱仪(TOF-SIMS) 设备型号: PHI nano TOF Ⅱ. 技术参数: 1)低质量时质量分辨率:m/z = 28 (Si+)和29 (SiH+) 的m/∆m ≥ 12,000. 2)高质量时质量分辨 …
0DWHULDO (6, IRU&KHP&RPP 7KLV Supplementary Information …
WebbTOF-SIMS 、钙钛矿太阳 ... 深入研究,材料学院于2024年建立了先进材料实验中心,配备了飞行时间二次离子质谱仪( TOF-SIMS,PHI Nano TOF II )、扫描微聚焦式X射线光电 … WebbDescription. PHI’s patented Parallel Imaging MS/MS mass spectrometer provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, … hideaways beach united states
TOF-SIMS Parallel Imaging MS/MS - Covalent Metrology Analytical …
WebbPHI nano TOF: 仕様: 励起源(一次イオン照射系) ビスマスイオン銃 スパッタイオン銃 Arガスクラスターイオン銃(GCIB) 分析系 飛行時間型質量分析計、三重収束型静電 … Webb27 okt. 2024 · Nanofiber Frame II is a type of Upgrade Material in Tower of Fantasy. ... Nano Coating II: Nano Coating III: Nanofiber Frame I: Nanofiber Frame II: Nanofiber … Webb12 nov. 2024 · Efficient one-pot synthesis of new series of furylpyrazolino[60]fullerene derivatives was prepared by [3 + 2] cycloaddition reaction mediated with (diacetoxyiodo)benzene (PhI(OAc)2) as an oxidant in o-dichlorobenzene (ODCB) under microwave irradiation. Different techniques have been used to confirm the structural … howes incorporated