Phi nanotof ii time-of-flight sims

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August undefined, 2024

Webb2、面扫+分析. 导出客户指定离子的 MAPPING, 所有离子统一用Thermal 颜色:右边的色标可以看出黑色是分布没有的区域，黄色白色是分布较多的区域； 3、深度剖析+数据分析. 仪器型号1：TOF-SIMS 5 iontof--快递交替模式--深度剖析. 深度曲线-相对应的3D图. 仪器型 … WebbTime-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is powerful analytical technique that has been heavily utilized to analyze surface chemistries due to its very shallow sampling depth (10-20 Å), high chemical sensitivity, and ability to provide elemental and molecular information. Additionally, TOFSIMS can produce chemical …

Parallel imaging MS/MS TOF-SIMS instrument - phi.com

WebbPHI’s revolutionary and patented Parallel Imaging MS/MS spectrometer technology obliterates this limitation with an integrated and lossless time-of-flight (TOF) tandem MS (MS 2) capability that makes use of high … WebbTOF-SIMS allows monitoring of all species of interest simultaneously, and with high mass resolution. Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is an analytical … first tech atm card

ToF-SIMS Parallel Imaging MS/MS of Lipid Species in Thin Tissue ...

http://2mstrumenti.com/time-of-flight-sims-phi-nanotof-ii/ WebbCaracterísticas principales. Resolución espacial: < 500 nm (Z), < 200 nm (X, Y) Resolución espectral: ~ 0.25 cm-1. Exactitud de longitud de onda: 0.005 nm (1800 l / mm) Alta sensibilidad: La banda de silicio de cuarto orden a 1940 cm-1 se puede observar en menos de un minuto usando un láser de baja intensidad. Se pueden usar hasta 5 láseres. WebbSurface Analysis Instruments and Equipment PHI camper hitch sway bars

PHI TRIFT V nanoTOF Time-of-Flight Secondary Ion Mass …

Products:TOF-SIMS/PHI nTOF 3 l ULVAC-PHI, Inc

WebbThe authors have developed a parallel imaging MS/MS capability for the PHI nanoTOF II time-of-flight secondary ion mass spectrometry (TOF-SIMS) instrument. The unique design allows a 1 Da wide precursor mass window to be extracted from a stream of mass separated secondary ions while all other secondary ions are detected in the normal … http://siss-sims.com/seikei/SISS/SIMS7_160714/3%e2%80%902%20%e3%82%a2%e3%83%ab%e3%83%90%e3%83%83%e3%82%af%e3%83%95%e3%82%a1%e3%82%a4%e3%80%80%e6%9c%80%e6%96%b0%e6%8a%80%e8%a1%93%e6%83%85%e5%a0%b1.pdf camper hire cairns qldWebb16 mars 2016 · Collision-induced dissociation Tissue cells ABSTRACT The authors have developed a parallel imaging MS/MS capability for the PHI nanoTOF II time-of-flight … camper horse trailer for sale

"WebbPHI nanoTOF II PHI’s patented TRIFT mass spectrometer provides superior sensitivity, low spectral background, and the unique ability to image highly topographic surfaces. The … " - Phi nanotof ii time-of-flight sims

Phi nanotof ii time-of-flight sims

ToF-SIMS Parallel Imaging MS/MS of Lipid Species in Thin Tissue ...

WebbPHI nanoTOF II TOF-SIMS Analysis with <70 nm spatial resolution Surface sensitive molecular imaging and trace analysis Multiple ion beams available for optimized depth profiling of organics, inorganics and mixed … WebbTime-of-flight secondary-ion mass spectrometry (TOF-SIMS) provides sub-micrometer elemental, chemical, and molecular characterization and imaging of solid surfaces. …

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WebbTOF-SIMS Analysis of Organic LED Thin Films Overview: Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) offers great potential for the analysis of components in … WebbThe newest option for the nanoTOF II, Parallel Imaging MS/MS, allows secondary ions of choice to be extracted from the TOF-SIMS data stream for fragmentation and analysis …

WebbFigure 2. Elemental and Molecular imaging: Images of a cross-sectioned drug pellet for the molecular ion of the drug and an atomic species. 1 Time-of-Flight Secondary Ion Mass Spectrometry Secondary ions then travel through a field-free analyzer with different velocities, depending on their mass-to-charge ratio (ke=1/2mv 2). For each primary Webb• Used time-of-flight secondary ion mass spectrometry (TOF-SIMS) for surface characterization of materials for new product development as well as root cause analysis.

WebbTOF-SIMS. TOF-SIMS PHI nanoTOF 3; TOF-SIMS PHI nanoTOF II Time-of-Flight SIMS; Videos TOF-SIMS; Aplicaciones TOF-SIMS; Microscopía Electrónica in Situ. Cátodo luminiscencia y fluorescencia in situ. Equipos Delmic; Medidas in Situ en TEM; Tecnología de Plasma; Estación de puntas para SEM; Micromanipuladores; Cryoholders para TEM

WebbTime of flight secondary ion mass spectroscopy (ToF-SIMS) is a highly surface-specific analytical technique used to qualitatively assess the composition of elements and …

WebbIntroduction of PHI nanoTOFII Applications 2 1) FIB-TOF-SIMS 2) MS/MS Summary. XPS ... PHI 710 PHI nanoTOF II Time-of-Flight SIMS PHI 4800 PHI ADEPT-1010 Quadrupole SIMS. PHI VersaProbeIII PHI 4800 PHI New Products 4 Scanning micro focus X-ray source High sensitivity Ultimate depth resolution Various types of options SCA analyzer enables … first tech address mailingWebbTOF-SIMS instruments. View as: Showing the single result. Quick View. Physical Electronics, Inc. (PHI) PHI nanoTOF II Time-of-Flight SIMS. TRIFT mass analyzer; 30 kV LMIG with Bi, Au, or Ga emitter; Dual beam charge neutralization; 5 axis sample stage; In-situ optical viewing; Secondary electron detector; WinCadence instrument control and … camper huren amersfoortWebbThe PHI NanoTOF II mass spectrometer is equipped with a high-energy collision induced dissociation (CID) fragmentation cell as well as a second time-of-flight analyzer … camper hitches and sway barsWebbPHI nanoTOF 3 offers TOF-SIMS analysis with a high spatial resolution of 500 nm in high mass resolution mode and 50 nm in high spatial resolution mode. The combination of a … camper huren bad bentheimWebb1 maj 2016 · Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used widely throughout industrial and academic research due to the high information content of the … camper huren bilbaoWebbThe PHI nanoTOF II Parallel Imaging MS/MS platform has established itself as uniquely capable of providing superior analytical data, even on the most challenging samples. The … camper hot water heater gas valveWebb31 okt. 2024 · Under its X-ray photoelectron spectroscopy (XPS) category, the company’s products include PHI Quantes, PHI 5000 VersaProbe III, PHI Quantera II and PHI X-tool. PHI 710 engages in Auger... first tech atm finder